Special session: Hot topic: Smart silicon

Special session: Hot topic: Smart silicon

The goal of this hot topic session is to discuss this cutting-edge topic that is being researched by several teams in both academia and industry, and debate which is the best approach for sub-65nm silicon designs. The point of debate will be what embedded circuits make the most sense (aging, enablem...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Winemberg, L, Tehranipoor, M
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Aging
Artificial intelligence
Economics
Indium tin oxide
Lead
Monitoring
Stacking
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Beschreibung
Zusammenfassung:The goal of this hot topic session is to discuss this cutting-edge topic that is being researched by several teams in both academia and industry, and debate which is the best approach for sub-65nm silicon designs. The point of debate will be what embedded circuits make the most sense (aging, enablement of more aggressive design, characterization, diagnosis, debug, etc.).
ISSN:1093-0167
2375-1053
DOI:10.1109/VTS.2011.5783742