Study on the method of selecting test nodes based on ambiguity entropy

Study on the method of selecting test nodes based on ambiguity entropy

The issue of test node selection for the fault diagnosis of analog circuit is studied in this paper. The formula of computing the ambiguity entropy of the test node is defined and a new algorithm of selecting test node based on the ambiguity entropy is presented. The practical application proves tha...

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Bibliographische Detailangaben
Hauptverfasser: Du Minjie, Cai Jinyan, Chen Peng, Zhu Sai
Format: Tagungsbericht
Sprache:eng
Schlagworte:
ambiguity entropy
analog circuit
Analog circuits
Circuit faults
Computer aided instruction
Dictionaries
Entropy
Fault diagnosis
Real time systems
test node selection
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Beschreibung
Zusammenfassung:The issue of test node selection for the fault diagnosis of analog circuit is studied in this paper. The formula of computing the ambiguity entropy of the test node is defined and a new algorithm of selecting test node based on the ambiguity entropy is presented. The practical application proves that the algorithm can cut the test node to the bone and enhances the correctness and real time of fault diagnosis.
DOI:10.1109/ICEICE.2011.5777590