A Simple Algorithm for Bayesian Signal Analysis With Applications to Metrology

A Simple Algorithm for Bayesian Signal Analysis With Applications to Metrology

A Bayesian approach to spectrum analysis using approximations based on the posterior mode is applied here to waveform metrology. A simple algorithm for obtaining accurate estimates of signal parameters and their associated uncertainties is presented. It is assumed that the data can be modeled with t...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2011-07, Vol.60 (7), p.2314-2319
1. Verfasser: Kyriazis, G A
Format: Artikel
Sprache:eng
Schlagworte:
Algorithm design and analysis
Algorithms
Approximation
Bayesian analysis
Bayesian inference
Bayesian methods
calibration
flicker
Harmonic analysis
harmonics
Instrumentation
Mathematical analysis
Mathematical models
Metrology
Modulation
Noise
sampling methods
signal analysis
Uncertainty
Voltage measurement
Waveforms
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Beschreibung
Zusammenfassung:A Bayesian approach to spectrum analysis using approximations based on the posterior mode is applied here to waveform metrology. A simple algorithm for obtaining accurate estimates of signal parameters and their associated uncertainties is presented. It is assumed that the data can be modeled with trigonometric equations. The algorithm can be easily implemented with those commercial laboratory software packages routinely used by metrologists for controlling instrumentation and reporting measurement results. Its performance has been confirmed through several experimental setups.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2011.2113810