Extracting physical IC models using near-field scanning

Accurate modeling of chip and chip-package is critical for EMI (Electromagnetic Interference) and RFI (RF Interference) analysis and prediction. In this paper, a model based on an array of dipoles from near-field measurement is proposed. A simple active circuit is simulated in a 3-D full-wave simula...

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Hauptverfasser: Zhenwei Yu, Jayong Koo, Mix, J A, Slattery, K, Jun Fan
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:Accurate modeling of chip and chip-package is critical for EMI (Electromagnetic Interference) and RFI (RF Interference) analysis and prediction. In this paper, a model based on an array of dipoles from near-field measurement is proposed. A simple active circuit is simulated in a 3-D full-wave simulation tool, and the dipole model is calculated from the near-field data in the simulation using inverse method with regularization technique. This model has clear physical meaning, and it is validated using field at other place.
ISSN:2158-110X
2158-1118
DOI:10.1109/ISEMC.2010.5711292