Cost effective 28nm LP SoC technology optimized with circuit/device/process co-design for smart mobile devices

With newer technology nodes, circuit/device/process codesign is essential to realize the advantages of scaling. Leveraging co-design approach based on a well-established manufacturing flow, a cost effective 28 nm 4G SOC technology has been crafted. This 28 nm design strategy uses two sets of design...

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Hauptverfasser: Chidambaram, P R, Gan, C, Sengupta, S, Ge, L, Chen, Y, Yang, S, Liu, P, Wang, J, Yang, M, Teng, C, Du, Y, Patel, P, Kamal, P, Bucki, R, Vang, F, Datta, A, Bellur, K, Yoon, S, Chen, N, Thean, A, Han, M, Terzioglu, E, Zhang, X, Fischer, J, Sani, M, Flederbach, B, Yeap, G
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:With newer technology nodes, circuit/device/process codesign is essential to realize the advantages of scaling. Leveraging co-design approach based on a well-established manufacturing flow, a cost effective 28 nm 4G SOC technology has been crafted. This 28 nm design strategy uses two sets of design rules and 7 different Vt cells with optimal power gating to achieve a 2.4× increase in gate density, 55% decrease in power and 30% gain in frequency with respect to the 45 nm counterpart. Relevant technical tradeoffs between the design/technology interactions are discussed to illustrate the codesign aspects.
ISSN:0163-1918
2156-017X
DOI:10.1109/IEDM.2010.5703432