Concurrent test planning

Concurrent test planning

Testing multiple device functions in parallel can yield significant test time and cost of test reductions. This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Van Wagenen, B, Seng, E
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Complexity theory
Computers
Concurrent computing
Pins
Planning
Resource management
Testing
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Beschreibung
Zusammenfassung:Testing multiple device functions in parallel can yield significant test time and cost of test reductions. This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2010.5699255