Built-In Current Sensor for testing Current Feedback Operational Amplifier

Built-In Current Sensor for testing Current Feedback Operational Amplifier

This paper presents novel Built In Sensor (BIS) to test a well-known analog building block; the Current Feedback Operational Amplifier (CFOA). The proposed BIS tests on the terminal characteristics of the analog block. It has no voltage degradation. Moreover, it has a simple design, very small area...

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Bibliographische Detailangaben
Hauptverfasser: Ahmed, R F, Madian, A H, Radwan, A G, Soliman, A M
Format: Tagungsbericht
Sprache:eng
Schlagworte:
analog test
Band pass filters
BICS
Circuit faults
CMOS integrated circuits
Current measurement
design for testability
Semiconductor device modeling
Testing
Topology
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Beschreibung
Zusammenfassung:This paper presents novel Built In Sensor (BIS) to test a well-known analog building block; the Current Feedback Operational Amplifier (CFOA). The proposed BIS tests on the terminal characteristics of the analog block. It has no voltage degradation. Moreover, it has a simple design, very small area and can detect both short and open circuit faults. Simulations are made to test CFOA-based universal analog filter. A comparison with the conventional I DDQ test is given and it proves that the proposed BIS has a superior performance.
ISSN:2159-1660
DOI:10.1109/ICM.2010.5696155