A transistor matching technology improving effectively DC resolution of current-steering DAC

A transistor matching technology improving effectively DC resolution of current-steering DAC

The requirements of segmented current-steering DAC's MSB part for transistor matching are very high. In this paper, a diagonal layout is presented which can meet very well the requirements of 12-bit DAC monotonicity. The DAC was developed in TSMC 0.18um process technology. As a result of measur...

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Bibliographische Detailangaben
Hauptverfasser: Pu Luo, Weidong Yang, Dongbing Fu, Jinshan Yu
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Current measurement
Fluctuations
Layout
MOSFETs
Systematics
Temperature measurement
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Beschreibung
Zusammenfassung:The requirements of segmented current-steering DAC's MSB part for transistor matching are very high. In this paper, a diagonal layout is presented which can meet very well the requirements of 12-bit DAC monotonicity. The DAC was developed in TSMC 0.18um process technology. As a result of measurements, the static errors are: DNL=±0.15LSB, and INL=±0.2LSB.
DOI:10.1109/ICSICT.2010.5667788