Self-heating effects in analog Bulk and SOI CMOS circuits

In this work, we study the impact of device self-heating on Bulk and double-gate silicon-on-insulator (DGSOI) technologies using self-consistent electrothermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of self-h...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Roy, U, Sangiorgi, E, Fiegna, C
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Admittance Heating Logic gates MOSFETs Performance evaluation Silicon
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