Self-heating effects in analog Bulk and SOI CMOS circuits

Self-heating effects in analog Bulk and SOI CMOS circuits

In this work, we study the impact of device self-heating on Bulk and double-gate silicon-on-insulator (DGSOI) technologies using self-consistent electrothermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of self-h...

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Bibliographische Detailangaben
Hauptverfasser: Roy, U, Sangiorgi, E, Fiegna, C
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Admittance
Heating
Logic gates
MOSFETs
Performance evaluation
Silicon
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Beschreibung
Zusammenfassung:In this work, we study the impact of device self-heating on Bulk and double-gate silicon-on-insulator (DGSOI) technologies using self-consistent electrothermal (ET) simulations. Device characteristics of Bulk and DGSOI MOSFETs have been studied to estimate device performance and the impact of self-heating on the same. Self-heating effect (SHE) on the AC performance has also been studied for these two technologies.
DOI:10.1109/ICSICT.2010.5667366