High power microwave pulse impact on an all-dielectric lithium niobate modulator

Measurements and multiphysics simulations of all-dielectric LiNbO 3 grating modulators exposed to high power microwave pulses were conducted. Thinned substrate devices exposed to 180kV/cm fields show no significant degradation in measured optical spectrum or link gain.

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Bibliographische Detailangaben
Hauptverfasser: Schaffner, J H, Geary, K, Yap, D, Efimov, O, White, D A, Stowell, M L, Brown, C G, Levine, J S
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:Measurements and multiphysics simulations of all-dielectric LiNbO 3 grating modulators exposed to high power microwave pulses were conducted. Thinned substrate devices exposed to 180kV/cm fields show no significant degradation in measured optical spectrum or link gain.
DOI:10.1109/MWP.2010.5664201