Investigation and Analysis of LM124 Bipolar Linear Circuitry Response Phenomenon in Pulsed X-Ray Environment

Analog Transient Radiation Effects in Electronics (ATREE) induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in a LM124 operational amplifier configured in three different bias configurations are investigated. A predictive methodology, based upon...

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Veröffentlicht in:IEEE transactions on nuclear science 2010-12, Vol.57 (6), p.3392-3399
Hauptverfasser: Roche, N J, Dusseau, L, Vaille, J, Mekki, J, Velo, Y G, Perez, S, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azais, B
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Sprache:eng
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