Surface analysis for NEA GaAs photocathode

To study the effect surface defects imposed on NEA GaAs photocathode, a surface analysis instrument shown in Fig. 1 has been designed, which is composed of a microimager, a 2-D displacement platform, an auto-focus equipment, a computer.

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Bibliographische Detailangaben
Hauptverfasser: Zhang, J J, Chang, B K, Fu, R G, Qiu, Y F, Qian, Y S
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:To study the effect surface defects imposed on NEA GaAs photocathode, a surface analysis instrument shown in Fig. 1 has been designed, which is composed of a microimager, a 2-D displacement platform, an auto-focus equipment, a computer.
DOI:10.1109/IVESC.2010.5644320