Birefringence characterization on SOI waveguide using optical low coherence interferometry

An optical low-coherence interferometry was utilized to characterize the birefringence on 5-μm thick silicon-on-insulator waveguides. The SMF-28 fiber was taken as a baseline to demonstrate 2.6×10 -3 waveguide birefringence with 5-μm width and 2.5-μm etch depth.

Bibliographische Detailangaben

Hauptverfasser:	Shih-Hsiang Hsu, Sheng-Chieh Tseng, Hui-Zhi You
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Birefringence Coherence interferometry Effective index Optical fiber sensors Optical fibers Optical interferometry Optical polarization Optical waveguides
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