Analysis on the reliability of IED and GOOSE network in 500kV substation based on IEC61850 standard

The IEC61850 standard is the next generation of power substation. The reliability of IEC61850 substation more and more depends on new Intelligence Electronic Device (IED) and General Object Oriented Substation Event (GOOSE) network. As the highest voltage level IEC 61850 substation in China, all of...

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Bibliographische Detailangaben
Hauptverfasser: Song Yang, Shen Diqiu, Li Ming, Pan Jimeng, Tan Yan
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:The IEC61850 standard is the next generation of power substation. The reliability of IEC61850 substation more and more depends on new Intelligence Electronic Device (IED) and General Object Oriented Substation Event (GOOSE) network. As the highest voltage level IEC 61850 substation in China, all of IED and GOOSE network in 500kV Guilin substation were carefully tested, dynamic simulated and put into practice. The paper introduced general situation about 500kV Guilin IEC 61850 substation. After that, the paper summarized problems about this new generation technology appeared in simulation and factual operation. Finally the paper concluded the IEC61850 devices and network is reliable in 500kV substation.
ISSN:2161-9069
DOI:10.1109/ICCASM.2010.5622132