Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

Bibliographische Detailangaben

Hauptverfasser:	Cochran, Donna J, Dakai Chen, Oldham, Timothy R, Sanders, Anthony B, Kim, Hak S, Campola, Michael J, Buchner, Stephen P, LaBel, Kenneth A, Marshall, Cheryl J, Pellish, Jonathan A, Carts, Martin A, O'Bryan, Martha V
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Breakdown voltage CMOS integrated circuits CMOS technology Degradation NASA Protons Radiation effects
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