Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

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Bibliographische Detailangaben
Hauptverfasser: Cochran, Donna J, Dakai Chen, Oldham, Timothy R, Sanders, Anthony B, Kim, Hak S, Campola, Michael J, Buchner, Stephen P, LaBel, Kenneth A, Marshall, Cheryl J, Pellish, Jonathan A, Carts, Martin A, O'Bryan, Martha V
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Breakdown voltage
CMOS integrated circuits
CMOS technology
Degradation
NASA
Protons
Radiation effects
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Beschreibung
Zusammenfassung:Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
ISSN:2154-0519
DOI:10.1109/REDW.2010.5619507