Commercially Designed and Manufactured SDRAM SEE Data

Commercially Designed and Manufactured SDRAM SEE Data

A commercially designed and manufactured 512Mb SDRAM is Single Event Latchup (SEL) immune and 100 krad(Si) TID tolerant. It is packaged for application use into both a 2.5Gb and a 3Gb MCM configuration. The Single Event Effects (SEE) performance is reported.

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Bibliographische Detailangaben
Hauptverfasser: Hafer, Craig, Von Thun, Matthew, Leslie, Mike, Sievert, Fred, Jordan, Anthony
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Arrays
Ion beams
Ions
Radiation effects
SDRAM
Springs
Testing
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Beschreibung
Zusammenfassung:A commercially designed and manufactured 512Mb SDRAM is Single Event Latchup (SEL) immune and 100 krad(Si) TID tolerant. It is packaged for application use into both a 2.5Gb and a 3Gb MCM configuration. The Single Event Effects (SEE) performance is reported.
ISSN:2154-0519
DOI:10.1109/REDW.2010.5619497