Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: O'Bryan, Martha V, LaBel, Kenneth A, Pellish, Jonathan A, Dakai Chen, Lauenstein, Jean-Marie, Marshall, Cheryl J, Ladbury, Ray L, Oldham, Timothy R, Kim, Hak S, Phan, Anthony M, Berg, Melanie D, Carts, Martin A, Sanders, Anthony B, Buchner, Stephen P, Marshall, Paul W, Xapsos, Michael A, Irom, Farokh, Pearce, Larry G, Thomson, Eric T, Bernard, Theju M, Satterfield, Harold W, Williams, Alan P, van Vonno, Nick W, Salzman, James F, Burns, Sam, Albarian, Rafi S
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Atmospheric measurements
CMOS integrated circuits
Electronic mail
NASA
Particle measurements
Protons
Testing
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
ISSN:2154-0519
DOI:10.1109/REDW.2010.5619494