New method suitable for relative short distance measurement
A new method for relative short distance measurement of reflective surfaces was designed. The relative distance is derived from a frequency where two interfering coherent signals (one is reflected from the measured object, the second is a reference one) create a sharp signal minimum. The viability o...
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| Format: | Tagungsbericht |
| Sprache: | eng |
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| Zusammenfassung: | A new method for relative short distance measurement of reflective surfaces was designed. The relative distance is derived from a frequency where two interfering coherent signals (one is reflected from the measured object, the second is a reference one) create a sharp signal minimum. The viability of the method was preliminary experimentally verified in X-band. Potential possibilities of the method were tested by software simulation. Sub-micron distance resolution in industrial applications can be supposed. |
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| DOI: | 10.23919/EUMC.2010.5616423 |