Programming Flash Memory with boundary scan using general purpose digital instrumentation

This paper details the on-board JTAG programming of a Flash Memory using typical digital test instrumentation found in test systems rather than various boundary scan vendor proprietary hardware. Advantages to this technique, such as reduction in required equipment and reduced integration and support...

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Hauptverfasser:	Marchetti, T E, Borroz, T
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Boundary scan Deep Serial Memory Diffusion tensor imaging Digital Flash memory IEEE 1149.1 Instruments Integrated circuits JTAG Pins Programming Registers
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creator	Marchetti, T E Borroz, T
description	This paper details the on-board JTAG programming of a Flash Memory using typical digital test instrumentation found in test systems rather than various boundary scan vendor proprietary hardware. Advantages to this technique, such as reduction in required equipment and reduced integration and support costs, are discussed.
doi_str_mv	10.1109/AUTEST.2010.5613599
format	Conference Proceeding
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Boundary scan Deep Serial Memory Diffusion tensor imaging Digital Flash memory IEEE 1149.1 Instruments Integrated circuits JTAG Pins Programming Registers
title	Programming Flash Memory with boundary scan using general purpose digital instrumentation
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