Programming Flash Memory with boundary scan using general purpose digital instrumentation

Programming Flash Memory with boundary scan using general purpose digital instrumentation

This paper details the on-board JTAG programming of a Flash Memory using typical digital test instrumentation found in test systems rather than various boundary scan vendor proprietary hardware. Advantages to this technique, such as reduction in required equipment and reduced integration and support...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Marchetti, T E, Borroz, T
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Boundary scan
Deep Serial Memory
Diffusion tensor imaging
Digital
Flash memory
IEEE 1149.1
Instruments
Integrated circuits
JTAG
Pins
Programming
Registers
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Beschreibung
Zusammenfassung:This paper details the on-board JTAG programming of a Flash Memory using typical digital test instrumentation found in test systems rather than various boundary scan vendor proprietary hardware. Advantages to this technique, such as reduction in required equipment and reduced integration and support costs, are discussed.
ISSN:1088-7725
1558-4550
DOI:10.1109/AUTEST.2010.5613599