Impulse sub-nanosecond reflectometry
Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in...
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| creator | Berdin, S A Karelin, S Y Korenev, V G Magda, I I Mukhin, V S Naboka, A M Soshenko, V A |
| description | Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in non-uniform system is proposed. |
| doi_str_mv | 10.1109/UWBUSIS.2010.5609118 |
| format | Conference Proceeding |
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Impacts of non-uniformities in the system to the measured signal parameters are analyzed. 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Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in non-uniform system is proposed.</description><subject>Data processing</subject><subject>Impedance</subject><subject>impulse reflectometry</subject><subject>non-uniform systems</subject><subject>Oscilloscopes</subject><subject>Reflection</subject><subject>Reflectometry</subject><subject>Sub-nanosecond</subject><subject>Transmission line measurements</subject><subject>Ultra wideband technology</subject><subject>ultrawideband systems</subject><isbn>9781424474707</isbn><isbn>1424474701</isbn><isbn>9781424474691</isbn><isbn>1424474698</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpNjz9rwzAUxFVKoSX1J0iHDF2dvic9ydLYhv4xBDokIWOQ7Cdwie1gOUO-fQ3N0FuO-3EcnBBPCEtEcC-7_dtuU26WEiaiDThEeyMyV1gkSVSQcXj7PxdQ3IsspR-YRFpqMA_iuWxP52PiRTqHvPNdn7jqu3oxcDxyNfYtj8PlUdxFP5Wyq8_E9uN9u_rK19-f5ep1nTcOxpwgOomskDDGYA1oY4OsrCcTpK4xeHCutsoaZyJ5CRGjU8DS68i6JjUT87_ZhpkPp6Fp_XA5XK-pXzpOQYw</recordid><startdate>201009</startdate><enddate>201009</enddate><creator>Berdin, S A</creator><creator>Karelin, S Y</creator><creator>Korenev, V G</creator><creator>Magda, I I</creator><creator>Mukhin, V S</creator><creator>Naboka, A M</creator><creator>Soshenko, V A</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201009</creationdate><title>Impulse sub-nanosecond reflectometry</title><author>Berdin, S A ; Karelin, S Y ; Korenev, V G ; Magda, I I ; Mukhin, V S ; Naboka, A M ; Soshenko, V A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-40f921e3141ffb860568b2c8a46b25d1ba099d838696f4a20f1f930e2a5fe5d43</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Data processing</topic><topic>Impedance</topic><topic>impulse reflectometry</topic><topic>non-uniform systems</topic><topic>Oscilloscopes</topic><topic>Reflection</topic><topic>Reflectometry</topic><topic>Sub-nanosecond</topic><topic>Transmission line measurements</topic><topic>Ultra wideband technology</topic><topic>ultrawideband systems</topic><toplevel>online_resources</toplevel><creatorcontrib>Berdin, S A</creatorcontrib><creatorcontrib>Karelin, S Y</creatorcontrib><creatorcontrib>Korenev, V G</creatorcontrib><creatorcontrib>Magda, I I</creatorcontrib><creatorcontrib>Mukhin, V S</creatorcontrib><creatorcontrib>Naboka, A M</creatorcontrib><creatorcontrib>Soshenko, V A</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Berdin, S A</au><au>Karelin, S Y</au><au>Korenev, V G</au><au>Magda, I I</au><au>Mukhin, V S</au><au>Naboka, A M</au><au>Soshenko, V A</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Impulse sub-nanosecond reflectometry</atitle><btitle>2010 5th International Confernce on Ultrawideband and Ultrashort Impulse Signals</btitle><stitle>UWBUSIS</stitle><date>2010-09</date><risdate>2010</risdate><spage>270</spage><epage>272</epage><pages>270-272</pages><isbn>9781424474707</isbn><isbn>1424474701</isbn><eisbn>9781424474691</eisbn><eisbn>1424474698</eisbn><abstract>Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in non-uniform system is proposed.</abstract><pub>IEEE</pub><doi>10.1109/UWBUSIS.2010.5609118</doi><tpages>3</tpages></addata></record> |
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| identifier | ISBN: 9781424474707 |
| ispartof | 2010 5th International Confernce on Ultrawideband and Ultrashort Impulse Signals, 2010, p.270-272 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Data processing Impedance impulse reflectometry non-uniform systems Oscilloscopes Reflection Reflectometry Sub-nanosecond Transmission line measurements Ultra wideband technology ultrawideband systems |
| title | Impulse sub-nanosecond reflectometry |
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