Impulse sub-nanosecond reflectometry

Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in...

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Bibliographische Detailangaben
Hauptverfasser:	Berdin, S A, Karelin, S Y, Korenev, V G, Magda, I I, Mukhin, V S, Naboka, A M, Soshenko, V A
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Data processing Impedance impulse reflectometry non-uniform systems Oscilloscopes Reflection Reflectometry Sub-nanosecond Transmission line measurements Ultra wideband technology ultrawideband systems
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Beschreibung
Zusammenfassung:	Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in non-uniform system is proposed.
DOI:	10.1109/UWBUSIS.2010.5609118