World's first monolithic 3D-FPGA with TFT SRAM over 90nm 9 layer Cu CMOS

World's first monolithically integrated Thin-Film-Transistor (TFT) SRAM configuration circuits over 90nm 9 layers of Cu interconnect CMOS is successfully fabricated at 300mm LSI mass production line for 3-dimensional Field Programmable Gate Arrays (3D-FPGA). This novel technology built over the...

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Hauptverfasser: Naito, T, Ishida, T, Onoduka, T, Nishigoori, M, Nakayama, T, Ueno, Y, Ishimoto, Y, Suzuki, A, Chung, W, Madurawe, R, Wu, S, Ikeda, S, Oyamatsu, H
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:World's first monolithically integrated Thin-Film-Transistor (TFT) SRAM configuration circuits over 90nm 9 layers of Cu interconnect CMOS is successfully fabricated at 300mm LSI mass production line for 3-dimensional Field Programmable Gate Arrays (3D-FPGA). This novel technology built over the 9 th layer of Cu metal features aggressively scaled amorphous Si TFT having 180nm transistor gate length, 20nm gate oxide, fully silicided gate, S/D, all below 400C processing essential to not impact underlying Cu interconnects. Low temperature TFT devices show excellent NTFT/PTFT transistor I on /I off ratios over 2000/100 respectively, operate at 3.3V, E-field scalable, and are stable for SRAM configuration circuits. We believe this 3D-TFT technology is a major breakthrough innovation to overcome the conventional CMOS device shrinking limitation.
ISSN:0743-1562
DOI:10.1109/VLSIT.2010.5556234