Detection of small defects by THz-waves for non-destructive testing in dielectric layered structures

Detection of small defects by THz-waves for non-destructive testing in dielectric layered structures

In this study, the small defects detection in dielectric layered structures by THz waves for nondestructive testing. Finite element method were used for modelling of the structures.

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Bibliographische Detailangaben
Hauptverfasser: Scherbatko, I S, Kuleshov, Y M
Format: Tagungsbericht
Sprache:eng
Schlagworte:
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Zusammenfassung:In this study, the small defects detection in dielectric layered structures by THz waves for nondestructive testing. Finite element method were used for modelling of the structures.
DOI:10.1109/MSMW.2010.5546032