Test of embedded analog circuits based on a built-in current sensor

This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltag...

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Bibliographische Detailangaben
Hauptverfasser:	Mozuelos, Román, Lechuga, Yolanda, Martínez, Mar, Bracho, Salvador
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analog circuits Benchmark testing Built-in current sensor Circuit faults Circuit testing Current measurement Current supplies Design for test Dynamic current test Integrated circuit measurements Integrated circuit testing Mixed-signal circuit System testing Voltage
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Beschreibung
Zusammenfassung:	This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.
ISSN:	1530-1877 1558-1780
DOI:	10.1109/ETSYM.2010.5512765