Application of probes with multiple outputs on probe-compensated EMC near-field measurements

Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enable...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Spang, Matthias, Stoeckel, Tina, Schubert, Goeran, Albach, Manfred
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Antenna measurements Calibration Circuit testing Electric variables measurement Electromagnetic compatibility Electromagnetic fields Electromagnetic interference Electromagnetic measurements EMC Magnetic field measurement Near-field scan Plane wave theory Probe calibration Probe compensation Probes
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