Application of probes with multiple outputs on probe-compensated EMC near-field measurements

Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enable...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Spang, Matthias, Stoeckel, Tina, Schubert, Goeran, Albach, Manfred
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Antenna measurements Calibration Circuit testing Electric variables measurement Electromagnetic compatibility Electromagnetic fields Electromagnetic interference Electromagnetic measurements EMC Magnetic field measurement Near-field scan Plane wave theory Probe calibration Probe compensation Probes
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enables the calculation of the electric and magnetic field components above a device under test. Results based on measurements are shown for the case of a short electric dipole probe with two outputs.
DOI:	10.1109/ICIT.2010.5472677