New cell of precision microwave dielectric substrates testing

High-Q dielectrical materials are widely used in modern microwave technology. The control of the quality of their production is the most important element of both modern and future technologies. Among different means of control of the dielectrics material parameters, the cells based on the junction 'round waveguides/radial waveguides' proved to be the most promising ones. The control is carried out by comparing the computed or standard frequency values with the measured frequencies of the waveguide-dielectric resonance of that substrate region, which is in the junction region. Restrictions are imposed on the thickness of the substrate and the value of its permittivity. An improved structure which eliminates these restrictions is described.