A 660 MB/s interface megacell portable circuit in 0.3 /spl mu/m-0.7 /spl mu/m CMOS ASIC

A byte-wide I/O cell with 660 MB/s data rate uses low-jitter DLL-generated clocks, self-calibrated controlled-current drivers, and linear amplifier input receivers. The CAD techniques developed allow the design to be ported to CMOS processes ranging from 0.7 /spl mu/m to 0.3 /spl mu/m. The chip is 0...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE journal of solid-state circuits 1996-12, Vol.31 (12), p.1995-2003
Hauptverfasser: Donnelly, K.S., Yiu-Fai Chan, Ho, J.T.C., Chanh V. Tran, Patel, S., Benedict Lau, Jun Kim, Pak Shing Chau, Huang, C., Wei, J., Leung Yu, Tarver, R., Kulkami, R., Stark, D., Johnson, M.G.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2003
container_issue 12
container_start_page 1995
container_title IEEE journal of solid-state circuits
container_volume 31
creator Donnelly, K.S.
Yiu-Fai Chan
Ho, J.T.C.
Chanh V. Tran
Patel, S.
Benedict Lau
Jun Kim
Pak Shing Chau
Huang, C.
Wei, J.
Leung Yu
Tarver, R.
Kulkami, R.
Stark, D.
Johnson, M.G.
description A byte-wide I/O cell with 660 MB/s data rate uses low-jitter DLL-generated clocks, self-calibrated controlled-current drivers, and linear amplifier input receivers. The CAD techniques developed allow the design to be ported to CMOS processes ranging from 0.7 /spl mu/m to 0.3 /spl mu/m. The chip is 0.9/spl times/3.4 mm/sup 2/ using 0.3 /spl mu/m rules.
doi_str_mv 10.1109/4.545823
format Article
fullrecord <record><control><sourceid>ieee_RIE</sourceid><recordid>TN_cdi_ieee_primary_545823</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>545823</ieee_id><sourcerecordid>545823</sourcerecordid><originalsourceid>FETCH-ieee_primary_5458233</originalsourceid><addsrcrecordid>eNp9js0KgkAYRYcoyH6gdavvBdRv1PFnaVLUQloY1E4mGWNiLJnRRW-fUNCu1eFwz-ISsqLoUIqJGzgsYLHnj4hFGYttGvmXMbEQaWwnHuKUzIy5DxoEMbXIOYUwRMg3rgH56ISueSWgEbcBSkH71B2_KgGV1FUvu6EBdHxwTaug6d3GRif6GWT5sYC0OGQLMqm5MmL55Zysd9tTtrelEKJstWy4fpWfq_7f8Q1GATrh</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A 660 MB/s interface megacell portable circuit in 0.3 /spl mu/m-0.7 /spl mu/m CMOS ASIC</title><source>IEEE Electronic Library (IEL)</source><creator>Donnelly, K.S. ; Yiu-Fai Chan ; Ho, J.T.C. ; Chanh V. Tran ; Patel, S. ; Benedict Lau ; Jun Kim ; Pak Shing Chau ; Huang, C. ; Wei, J. ; Leung Yu ; Tarver, R. ; Kulkami, R. ; Stark, D. ; Johnson, M.G.</creator><creatorcontrib>Donnelly, K.S. ; Yiu-Fai Chan ; Ho, J.T.C. ; Chanh V. Tran ; Patel, S. ; Benedict Lau ; Jun Kim ; Pak Shing Chau ; Huang, C. ; Wei, J. ; Leung Yu ; Tarver, R. ; Kulkami, R. ; Stark, D. ; Johnson, M.G.</creatorcontrib><description>A byte-wide I/O cell with 660 MB/s data rate uses low-jitter DLL-generated clocks, self-calibrated controlled-current drivers, and linear amplifier input receivers. The CAD techniques developed allow the design to be ported to CMOS processes ranging from 0.7 /spl mu/m to 0.3 /spl mu/m. The chip is 0.9/spl times/3.4 mm/sup 2/ using 0.3 /spl mu/m rules.</description><identifier>ISSN: 0018-9200</identifier><identifier>EISSN: 1558-173X</identifier><identifier>DOI: 10.1109/4.545823</identifier><identifier>CODEN: IJSCBC</identifier><language>eng</language><publisher>IEEE</publisher><subject>Application specific integrated circuits ; Circuit noise ; Clocks ; Delay ; Design automation ; Driver circuits ; Noise generators ; Random access memory ; Timing ; Working environment noise</subject><ispartof>IEEE journal of solid-state circuits, 1996-12, Vol.31 (12), p.1995-2003</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/545823$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/545823$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Donnelly, K.S.</creatorcontrib><creatorcontrib>Yiu-Fai Chan</creatorcontrib><creatorcontrib>Ho, J.T.C.</creatorcontrib><creatorcontrib>Chanh V. Tran</creatorcontrib><creatorcontrib>Patel, S.</creatorcontrib><creatorcontrib>Benedict Lau</creatorcontrib><creatorcontrib>Jun Kim</creatorcontrib><creatorcontrib>Pak Shing Chau</creatorcontrib><creatorcontrib>Huang, C.</creatorcontrib><creatorcontrib>Wei, J.</creatorcontrib><creatorcontrib>Leung Yu</creatorcontrib><creatorcontrib>Tarver, R.</creatorcontrib><creatorcontrib>Kulkami, R.</creatorcontrib><creatorcontrib>Stark, D.</creatorcontrib><creatorcontrib>Johnson, M.G.</creatorcontrib><title>A 660 MB/s interface megacell portable circuit in 0.3 /spl mu/m-0.7 /spl mu/m CMOS ASIC</title><title>IEEE journal of solid-state circuits</title><addtitle>JSSC</addtitle><description>A byte-wide I/O cell with 660 MB/s data rate uses low-jitter DLL-generated clocks, self-calibrated controlled-current drivers, and linear amplifier input receivers. The CAD techniques developed allow the design to be ported to CMOS processes ranging from 0.7 /spl mu/m to 0.3 /spl mu/m. The chip is 0.9/spl times/3.4 mm/sup 2/ using 0.3 /spl mu/m rules.</description><subject>Application specific integrated circuits</subject><subject>Circuit noise</subject><subject>Clocks</subject><subject>Delay</subject><subject>Design automation</subject><subject>Driver circuits</subject><subject>Noise generators</subject><subject>Random access memory</subject><subject>Timing</subject><subject>Working environment noise</subject><issn>0018-9200</issn><issn>1558-173X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNp9js0KgkAYRYcoyH6gdavvBdRv1PFnaVLUQloY1E4mGWNiLJnRRW-fUNCu1eFwz-ISsqLoUIqJGzgsYLHnj4hFGYttGvmXMbEQaWwnHuKUzIy5DxoEMbXIOYUwRMg3rgH56ISueSWgEbcBSkH71B2_KgGV1FUvu6EBdHxwTaug6d3GRif6GWT5sYC0OGQLMqm5MmL55Zysd9tTtrelEKJstWy4fpWfq_7f8Q1GATrh</recordid><startdate>199612</startdate><enddate>199612</enddate><creator>Donnelly, K.S.</creator><creator>Yiu-Fai Chan</creator><creator>Ho, J.T.C.</creator><creator>Chanh V. Tran</creator><creator>Patel, S.</creator><creator>Benedict Lau</creator><creator>Jun Kim</creator><creator>Pak Shing Chau</creator><creator>Huang, C.</creator><creator>Wei, J.</creator><creator>Leung Yu</creator><creator>Tarver, R.</creator><creator>Kulkami, R.</creator><creator>Stark, D.</creator><creator>Johnson, M.G.</creator><general>IEEE</general><scope/></search><sort><creationdate>199612</creationdate><title>A 660 MB/s interface megacell portable circuit in 0.3 /spl mu/m-0.7 /spl mu/m CMOS ASIC</title><author>Donnelly, K.S. ; Yiu-Fai Chan ; Ho, J.T.C. ; Chanh V. Tran ; Patel, S. ; Benedict Lau ; Jun Kim ; Pak Shing Chau ; Huang, C. ; Wei, J. ; Leung Yu ; Tarver, R. ; Kulkami, R. ; Stark, D. ; Johnson, M.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_5458233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Application specific integrated circuits</topic><topic>Circuit noise</topic><topic>Clocks</topic><topic>Delay</topic><topic>Design automation</topic><topic>Driver circuits</topic><topic>Noise generators</topic><topic>Random access memory</topic><topic>Timing</topic><topic>Working environment noise</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Donnelly, K.S.</creatorcontrib><creatorcontrib>Yiu-Fai Chan</creatorcontrib><creatorcontrib>Ho, J.T.C.</creatorcontrib><creatorcontrib>Chanh V. Tran</creatorcontrib><creatorcontrib>Patel, S.</creatorcontrib><creatorcontrib>Benedict Lau</creatorcontrib><creatorcontrib>Jun Kim</creatorcontrib><creatorcontrib>Pak Shing Chau</creatorcontrib><creatorcontrib>Huang, C.</creatorcontrib><creatorcontrib>Wei, J.</creatorcontrib><creatorcontrib>Leung Yu</creatorcontrib><creatorcontrib>Tarver, R.</creatorcontrib><creatorcontrib>Kulkami, R.</creatorcontrib><creatorcontrib>Stark, D.</creatorcontrib><creatorcontrib>Johnson, M.G.</creatorcontrib><jtitle>IEEE journal of solid-state circuits</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Donnelly, K.S.</au><au>Yiu-Fai Chan</au><au>Ho, J.T.C.</au><au>Chanh V. Tran</au><au>Patel, S.</au><au>Benedict Lau</au><au>Jun Kim</au><au>Pak Shing Chau</au><au>Huang, C.</au><au>Wei, J.</au><au>Leung Yu</au><au>Tarver, R.</au><au>Kulkami, R.</au><au>Stark, D.</au><au>Johnson, M.G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A 660 MB/s interface megacell portable circuit in 0.3 /spl mu/m-0.7 /spl mu/m CMOS ASIC</atitle><jtitle>IEEE journal of solid-state circuits</jtitle><stitle>JSSC</stitle><date>1996-12</date><risdate>1996</risdate><volume>31</volume><issue>12</issue><spage>1995</spage><epage>2003</epage><pages>1995-2003</pages><issn>0018-9200</issn><eissn>1558-173X</eissn><coden>IJSCBC</coden><abstract>A byte-wide I/O cell with 660 MB/s data rate uses low-jitter DLL-generated clocks, self-calibrated controlled-current drivers, and linear amplifier input receivers. The CAD techniques developed allow the design to be ported to CMOS processes ranging from 0.7 /spl mu/m to 0.3 /spl mu/m. The chip is 0.9/spl times/3.4 mm/sup 2/ using 0.3 /spl mu/m rules.</abstract><pub>IEEE</pub><doi>10.1109/4.545823</doi></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9200
ispartof IEEE journal of solid-state circuits, 1996-12, Vol.31 (12), p.1995-2003
issn 0018-9200
1558-173X
language eng
recordid cdi_ieee_primary_545823
source IEEE Electronic Library (IEL)
subjects Application specific integrated circuits
Circuit noise
Clocks
Delay
Design automation
Driver circuits
Noise generators
Random access memory
Timing
Working environment noise
title A 660 MB/s interface megacell portable circuit in 0.3 /spl mu/m-0.7 /spl mu/m CMOS ASIC
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T14%3A41%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20660%20MB/s%20interface%20megacell%20portable%20circuit%20in%200.3%20/spl%20mu/m-0.7%20/spl%20mu/m%20CMOS%20ASIC&rft.jtitle=IEEE%20journal%20of%20solid-state%20circuits&rft.au=Donnelly,%20K.S.&rft.date=1996-12&rft.volume=31&rft.issue=12&rft.spage=1995&rft.epage=2003&rft.pages=1995-2003&rft.issn=0018-9200&rft.eissn=1558-173X&rft.coden=IJSCBC&rft_id=info:doi/10.1109/4.545823&rft_dat=%3Cieee_RIE%3E545823%3C/ieee_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=545823&rfr_iscdi=true