Observer based junction temperature estimator in thermoelectrical aging

Transistor thermal model is nonlinear and highly dependent upon temperature. For reliability assessments, accurate estimation of the junction temperature is especially critical. This paper proposes a novel approach that employs an observer during thermoelectrical aging for estimation of the junction...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Ginart, Antonio, Ali, Irfan N, Barlas, Irtaza, Kalgren, Patrick W, Roemer, Michael J, Goebel, Kai
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Accelerated aging Circuit testing Degradation Equations Radio frequency Semiconductor materials Temperature dependence Temperature measurement Thermal variables measurement Thermoelectricity
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!