Observer based junction temperature estimator in thermoelectrical aging

Observer based junction temperature estimator in thermoelectrical aging

Transistor thermal model is nonlinear and highly dependent upon temperature. For reliability assessments, accurate estimation of the junction temperature is especially critical. This paper proposes a novel approach that employs an observer during thermoelectrical aging for estimation of the junction...

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Bibliographische Detailangaben
Hauptverfasser: Ginart, Antonio, Ali, Irfan N, Barlas, Irtaza, Kalgren, Patrick W, Roemer, Michael J, Goebel, Kai
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Accelerated aging
Circuit testing
Degradation
Equations
Radio frequency
Semiconductor materials
Temperature dependence
Temperature measurement
Thermal variables measurement
Thermoelectricity
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Beschreibung
Zusammenfassung:Transistor thermal model is nonlinear and highly dependent upon temperature. For reliability assessments, accurate estimation of the junction temperature is especially critical. This paper proposes a novel approach that employs an observer during thermoelectrical aging for estimation of the junction temperature based on available and measurable temperature data.
ISSN:1095-323X
2996-2358
DOI:10.1109/AERO.2010.5446831