Electronic apparatus parameters prediction with adaptive clustering procedure
In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 139 |
|---|---|
| container_issue | |
| container_start_page | 139 |
| container_title | |
| container_volume | |
| creator | Shcherbakova, Galyna Krylov, Viktor |
| description | In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched. |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5446173</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5446173</ieee_id><sourcerecordid>5446173</sourcerecordid><originalsourceid>FETCH-ieee_primary_54461733</originalsourceid><addsrcrecordid>eNp9issKwjAQRSMi-OoXuMkPCKlt0nYtFTfu3JchHXWkjzBJFf_eCrp1de7lnIlYFsZonRQqLqa_k2fazEXk_V0pFWfG7NJ8IU5lgzZw35GV4BwwhMHLD1sMyONkrMkG6jv5pHCTUIML9EBpm8GPBXXXsekt1gPjWswu0HiMvlyJzaE8749bQsTKMbXAr0qnqYmzJPlv3yqsO-E</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Electronic apparatus parameters prediction with adaptive clustering procedure</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Shcherbakova, Galyna ; Krylov, Viktor</creator><creatorcontrib>Shcherbakova, Galyna ; Krylov, Viktor</creatorcontrib><description>In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.</description><identifier>ISBN: 9665538756</identifier><identifier>ISBN: 1424463246</identifier><identifier>ISBN: 9789665538752</identifier><identifier>ISBN: 9781424463244</identifier><identifier>EISBN: 9665539019</identifier><identifier>EISBN: 9789665539018</identifier><language>eng</language><publisher>IEEE</publisher><subject>Adaptive clustering ; Automatic testing ; Clustering methods ; Covariance matrix ; Electronic equipment testing ; Extrapolation ; Iterative methods ; Multidimensional systems ; noise immunity ; Optimization methods ; parameters prediction ; Production ; sub-gradient ; Wavelet domain ; wavelet transformation</subject><ispartof>2010 International Conference on Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010, p.139-139</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5446173$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5446173$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Shcherbakova, Galyna</creatorcontrib><creatorcontrib>Krylov, Viktor</creatorcontrib><title>Electronic apparatus parameters prediction with adaptive clustering procedure</title><title>2010 International Conference on Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET)</title><addtitle>TCSET</addtitle><description>In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.</description><subject>Adaptive clustering</subject><subject>Automatic testing</subject><subject>Clustering methods</subject><subject>Covariance matrix</subject><subject>Electronic equipment testing</subject><subject>Extrapolation</subject><subject>Iterative methods</subject><subject>Multidimensional systems</subject><subject>noise immunity</subject><subject>Optimization methods</subject><subject>parameters prediction</subject><subject>Production</subject><subject>sub-gradient</subject><subject>Wavelet domain</subject><subject>wavelet transformation</subject><isbn>9665538756</isbn><isbn>1424463246</isbn><isbn>9789665538752</isbn><isbn>9781424463244</isbn><isbn>9665539019</isbn><isbn>9789665539018</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9issKwjAQRSMi-OoXuMkPCKlt0nYtFTfu3JchHXWkjzBJFf_eCrp1de7lnIlYFsZonRQqLqa_k2fazEXk_V0pFWfG7NJ8IU5lgzZw35GV4BwwhMHLD1sMyONkrMkG6jv5pHCTUIML9EBpm8GPBXXXsekt1gPjWswu0HiMvlyJzaE8749bQsTKMbXAr0qnqYmzJPlv3yqsO-E</recordid><startdate>201002</startdate><enddate>201002</enddate><creator>Shcherbakova, Galyna</creator><creator>Krylov, Viktor</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201002</creationdate><title>Electronic apparatus parameters prediction with adaptive clustering procedure</title><author>Shcherbakova, Galyna ; Krylov, Viktor</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_54461733</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Adaptive clustering</topic><topic>Automatic testing</topic><topic>Clustering methods</topic><topic>Covariance matrix</topic><topic>Electronic equipment testing</topic><topic>Extrapolation</topic><topic>Iterative methods</topic><topic>Multidimensional systems</topic><topic>noise immunity</topic><topic>Optimization methods</topic><topic>parameters prediction</topic><topic>Production</topic><topic>sub-gradient</topic><topic>Wavelet domain</topic><topic>wavelet transformation</topic><toplevel>online_resources</toplevel><creatorcontrib>Shcherbakova, Galyna</creatorcontrib><creatorcontrib>Krylov, Viktor</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shcherbakova, Galyna</au><au>Krylov, Viktor</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Electronic apparatus parameters prediction with adaptive clustering procedure</atitle><btitle>2010 International Conference on Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET)</btitle><stitle>TCSET</stitle><date>2010-02</date><risdate>2010</risdate><spage>139</spage><epage>139</epage><pages>139-139</pages><isbn>9665538756</isbn><isbn>1424463246</isbn><isbn>9789665538752</isbn><isbn>9781424463244</isbn><eisbn>9665539019</eisbn><eisbn>9789665539018</eisbn><abstract>In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.</abstract><pub>IEEE</pub></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 9665538756 |
| ispartof | 2010 International Conference on Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010, p.139-139 |
| issn | |
| language | eng |
| recordid | cdi_ieee_primary_5446173 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Adaptive clustering Automatic testing Clustering methods Covariance matrix Electronic equipment testing Extrapolation Iterative methods Multidimensional systems noise immunity Optimization methods parameters prediction Production sub-gradient Wavelet domain wavelet transformation |
| title | Electronic apparatus parameters prediction with adaptive clustering procedure |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T18%3A35%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Electronic%20apparatus%20parameters%20prediction%20with%20adaptive%20clustering%20procedure&rft.btitle=2010%20International%20Conference%20on%20Modern%20Problems%20of%20Radio%20Engineering,%20Telecommunications%20and%20Computer%20Science%20(TCSET)&rft.au=Shcherbakova,%20Galyna&rft.date=2010-02&rft.spage=139&rft.epage=139&rft.pages=139-139&rft.isbn=9665538756&rft.isbn_list=1424463246&rft.isbn_list=9789665538752&rft.isbn_list=9781424463244&rft_id=info:doi/&rft_dat=%3Cieee_6IE%3E5446173%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=9665539019&rft.eisbn_list=9789665539018&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5446173&rfr_iscdi=true |