Electronic apparatus parameters prediction with adaptive clustering procedure

In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.

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Bibliographische Detailangaben
Hauptverfasser:	Shcherbakova, Galyna, Krylov, Viktor
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Adaptive clustering Automatic testing Clustering methods Covariance matrix Electronic equipment testing Extrapolation Iterative methods Multidimensional systems noise immunity Optimization methods parameters prediction Production sub-gradient Wavelet domain wavelet transformation
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Beschreibung
Zusammenfassung:	In this paper noise immunity adaptive clustering is suggested. The application of this method for the electronic apparatus parameters prediction is researched.