Microwave scanning tomography local unit defects

This article analyzes the possibility of creating a microwave scanning tomography on the basis of existing microwave microscopes. An algorithm for the reconstruction of the size, depth and electrical parameters of the local unit heterogeneity on the basis of scanning at two at two different distance...

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Bibliographische Detailangaben
Hauptverfasser:	Melnyk, S I, Slipchenko, M I
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Atom optics Equations Force measurement local unit defects microwave scanning tomography Microwave sensors Nonuniform electric fields Optical microscopy Optical resonators reconstruction resolution Signal resolution Size measurement Tomography
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Beschreibung
Zusammenfassung:	This article analyzes the possibility of creating a microwave scanning tomography on the basis of existing microwave microscopes. An algorithm for the reconstruction of the size, depth and electrical parameters of the local unit heterogeneity on the basis of scanning at two at two different distances between the sensor and object.