Estimation of noise figure for conventional and multilayered avalanche photodiodes using the lucky drift model

Estimation of noise figure for conventional and multilayered avalanche photodiodes using the lucky drift model

A new technique for estimating the excess noise factor in conventional and multilayered avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using lucky drift concepts. In conventional photodiodes the importance of the dead space is demonstrated. In mult...

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Bibliographische Detailangaben
Hauptverfasser: Marsland, J.S., Woods, R.C., Brownhill, C.A., Gould, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Avalanche photodiodes
Charge carrier processes
Computer simulation
Heterojunctions
Impact ionization
Kinetic energy
Motion estimation
Noise figure
Noise generators
Random number generation
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Zusammenfassung:A new technique for estimating the excess noise factor in conventional and multilayered avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using lucky drift concepts. In conventional photodiodes the importance of the dead space is demonstrated. In multilayered photodiodes preliminary results show good agreement with other theoretical work.