A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling

A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling

A pseudo-multiple sampling technique for a low-noise CIS is implemented using a conventional column-parallel single-slope ADC structure with no additional circuitry. It is applied to a 1/3.2-inch 8Mpixel CIS. Measurement results show the technique effectively reduces dark temporal noise from 1.6e- t...

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Hauptverfasser: Yong Lim, Kyoungmin Koh, Kyungmin Kim, Han Yang, Juha Kim, Youngkyun Jeong, Seungjin Lee, Hansoo Lee, Sin-Hwan Lim, Yunseok Han, Jinwoo Kim, Jaecheol Yun, Seogheon Ham, Yun-Tae Lee
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit noise
CMOS image sensors
Counting circuits
Delay
Image converters
Image sampling
Noise reduction
Quantization
Sampling methods
Working environment noise
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Beschreibung
Zusammenfassung:A pseudo-multiple sampling technique for a low-noise CIS is implemented using a conventional column-parallel single-slope ADC structure with no additional circuitry. It is applied to a 1/3.2-inch 8Mpixel CIS. Measurement results show the technique effectively reduces dark temporal noise from 1.6e- to 1.2e- in 10 b ADC mode, and from 1.8e- to 1.1e- in 12b ADC mode.
ISSN:0193-6530
2376-8606
DOI:10.1109/ISSCC.2010.5433971