In-situ synchrotron X-ray diffraction measurement of epitaxial FeRh thin films

In-situ synchrotron X-ray diffraction measurement of epitaxial FeRh thin films

The magnetic properties and structure of FeRh thin film epitaxially grown onto MgO(001) substrate were studied by MPMS(Magnetic Properties Measure System) and in-situ temperature synchrotron XRD(X-ray Diffraction). The transition temperature of FeRh thin films was around 380 K. Both M-T curve and d-...

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Hauptverfasser: Sung-Uk Jang, Seungmin Hyun, Hwan Soo Lee, Soon-Ju Kwon, Ji-Hong Kim, Ki-Hoon Park, Hak-Joo Lee
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Heating
Lattices
Magnetic films
Magnetic properties
Materials science and technology
Substrates
Synchrotrons
Temperature
Transistors
X-ray diffraction
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Zusammenfassung:The magnetic properties and structure of FeRh thin film epitaxially grown onto MgO(001) substrate were studied by MPMS(Magnetic Properties Measure System) and in-situ temperature synchrotron XRD(X-ray Diffraction). The transition temperature of FeRh thin films was around 380 K. Both M-T curve and d-spacing changes correspond to each other very closely. Abrupt changes in the lattice constants can be observed from the in-situ analysis. Also, there is the likelihood of existence of a new phase.
ISSN:2159-3523
DOI:10.1109/INEC.2010.5424542