Forensic characterization of RF devices

We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices. Probe signals, device models, feature selection and classifier design are described, and experimental results are given to verify our approach.

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Bibliographische Detailangaben
Hauptverfasser: Mikkilineni, A.K., King-Smith, D., Gelfand, S.B., Delp, E.J.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices. Probe signals, device models, feature selection and classifier design are described, and experimental results are given to verify our approach.
ISSN:2157-4766
DOI:10.1109/WIFS.2009.5386490