Forensic characterization of RF devices
We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices. Probe signals, device models, feature selection and classifier design are described, and experimental results are given to verify our approach.
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Hauptverfasser: | , , , |
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | We present a framework for forensic identification of RF devices using specially designed probe signals. This framework applies to a broad range of devices. Probe signals, device models, feature selection and classifier design are described, and experimental results are given to verify our approach. |
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ISSN: | 2157-4766 |
DOI: | 10.1109/WIFS.2009.5386490 |