A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design

Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Algorithm design and analysis Attenuation Built-in self-test built-in self-test (BIST) content addressable memory (CAM) Design optimization Diffraction March test algorithm memory testing Microwave propagation Nonuniform electric fields Polarization Propagation losses ternary content addressable memory (TCAM) Testing
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.
ISSN:	1089-3539 2378-2250
DOI:	10.1109/TEST.2009.5355536