Disruption and damage of an electrooptic modulator by pulsed microwaves
These results demonstrate the ability of a commercial LiNbO 3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | These results demonstrate the ability of a commercial LiNbO 3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design. |
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DOI: | 10.1109/AVFOP.2009.5342719 |