Disruption and damage of an electrooptic modulator by pulsed microwaves

These results demonstrate the ability of a commercial LiNbO 3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.

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Bibliographische Detailangaben
Hauptverfasser: Schermer, Ross T, Bucholtz, Frank, Villarruel, Carl A, Gil, Jesus Gil, Andreadis, Tim D, Williams, Keith J
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:These results demonstrate the ability of a commercial LiNbO 3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.
DOI:10.1109/AVFOP.2009.5342719