Modeling of IC power supply and I/O ports from measurements

Modeling of IC power supply and I/O ports from measurements

This paper addresses the generation of behavioral models of digital ICs for signal and power integrity simulations. The proposed models are obtained by external port measurements and by the combined application of specialized state-of-the-art modeling techniques. The proposed approach is demonstrate...

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Bibliographische Detailangaben
Hauptverfasser: Stievano, I.S., Rigazio, L., Maio, I.A., Girardi, A., Izzi, R., Vitale, F., Lessio, T.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Digital integrated circuits
Flash memory
Impedance
Integrated circuit modeling
Integrated circuit testing
Logic testing
Power generation
Power measurement
Power supplies
Research and development
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Beschreibung
Zusammenfassung:This paper addresses the generation of behavioral models of digital ICs for signal and power integrity simulations. The proposed models are obtained by external port measurements and by the combined application of specialized state-of-the-art modeling techniques. The proposed approach is demonstrated on the I/O buffers and the core power supply ports of a commercial 90 nm flash memory.
ISSN:2165-4107
DOI:10.1109/EPEPS.2009.5338470