Distributed via connectivity in high resolution package power delivery modeling

High resolution electrical models can be generated for chip packaging power delivery networks. The lumped versus distributed stitching of vertical path connections such as micro-via and plated-through-holes can introduce various effects on the model predictions.

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Bibliographische Detailangaben
1. Verfasser: Vikinski, O.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:High resolution electrical models can be generated for chip packaging power delivery networks. The lumped versus distributed stitching of vertical path connections such as micro-via and plated-through-holes can introduce various effects on the model predictions.
ISSN:2165-4107
DOI:10.1109/EPEPS.2009.5338433