Self test system for integrated hall effect sensors
This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytica...
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| creator | Ionescu, M.-A. Bodner, C. Dineci, S. Brezeanu, G. |
| description | This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytical model is achieved, in order to evaluate the precision of the method. |
| doi_str_mv | 10.1109/SMICND.2009.5336656 |
| format | Conference Proceeding |
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A comparison between SPICE, and Simulink simulations and with an analytical model is achieved, in order to evaluate the precision of the method.</abstract><pub>IEEE</pub><doi>10.1109/SMICND.2009.5336656</doi><tpages>4</tpages></addata></record> |
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| ispartof | 2009 International Semiconductor Conference, 2009, Vol.2, p.533-536 |
| issn | 1545-827X 2377-0678 |
| language | eng |
| recordid | cdi_ieee_primary_5336656 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Automatic testing Circuit testing Equations Hall effect devices Low pass filters Magnetic hysteresis Magnetic sensors Mechanical sensors Sensor systems System testing |
| title | Self test system for integrated hall effect sensors |
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