Self test system for integrated hall effect sensors

This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytica...

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Hauptverfasser: Ionescu, M.-A., Bodner, C., Dineci, S., Brezeanu, G.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytical model is achieved, in order to evaluate the precision of the method.
ISSN:1545-827X
2377-0678
DOI:10.1109/SMICND.2009.5336656