Self test system for integrated hall effect sensors
This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytica...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | This paper presents a new way to test integrated Hall effect sensors, by converting the internal measured parameters into other parameters, which can be measured more easily, with less complex equipment and in a shorter time. A comparison between SPICE, and Simulink simulations and with an analytical model is achieved, in order to evaluate the precision of the method. |
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ISSN: | 1545-827X 2377-0678 |
DOI: | 10.1109/SMICND.2009.5336656 |