Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog prod...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kruckmeyer, K., Buchner, S.P., DasGupta, S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Assembly Fabrication Manufacturing processes Optical pulses Packaging Power supplies Resistors Semiconductor device manufacture Semiconductor lasers Testing
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!