Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog prod...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kruckmeyer, K., Buchner, S.P., DasGupta, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Assembly
Fabrication
Manufacturing processes
Optical pulses
Packaging
Power supplies
Resistors
Semiconductor device manufacture
Semiconductor lasers
Testing
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor's LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when evaluating SET test results.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2009.5336313