Analysis of a substrate leakage current at MMIC

Analysis of a substrate leakage current at MMIC

This paper describes characteristics of a substrate leakage current flowing to the substrate in millimeter wave CMOS IC. The effects of the substrate current are investigated according to operating modes of a power amplifier (PA) - class-A and class-B. Due to the characteristics of V and I at the dr...

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Bibliographische Detailangaben
Hauptverfasser: Joontae Park, Kihyun Kim, Eunil Cho, Sangwook Nam
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Avalanche breakdown
Breakdown voltage
CMOS process
Conductivity
Electric breakdown
Impedance
Leakage current
MMICs
Power generation
Substrates
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Beschreibung
Zusammenfassung:This paper describes characteristics of a substrate leakage current flowing to the substrate in millimeter wave CMOS IC. The effects of the substrate current are investigated according to operating modes of a power amplifier (PA) - class-A and class-B. Due to the characteristics of V and I at the drain, better performance could be expected in the operation of class-B.
ISSN:2162-2027
DOI:10.1109/ICIMW.2009.5324736