Microwave testing of exfoliation in a dielectric plate

A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed me...

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Bibliographische Detailangaben
Hauptverfasser: Dzhala, V.R., Kapko, L.I.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed method are evaluated.
ISSN:2165-3585
2165-3593
DOI:10.1109/DIPED.2009.5307269